## Determination of Probability of Photoelectrons Ejection and Surface Efficiency by Using Simulation Techniques

Mustafa . M ,Ayuel . K ,2011, Determination of Probability of Photoelectrons Ejection and Surface Efficiency by Using Simulation Techniques,Journal of Science and Technology,12 (1) ,pp:90-96

Authors:

By Mustafa . M ,Ayuel . K ,

Year:

2011

Keywords

Photon counting,Photoelectrons ejected random process,Monte Carlo
methods (Poisson process).

Abstract

The theory of photoelectrons counting statisticaly was simulated using
Monte Carlo Methods by means of Mat lab computer programs.The number of
photoelectrons is generated randomly and their average is calculated and displayed.
Three different experiments were simulated for numbers of photoelectrons ejected for
different data size and the probability of number of photoelectrons ejected was found
to be exponentially decaying with these numbers of photoelectrons ejected.
Graphical representation of counting rate against random time was also displayed.
The time of ejection of photoelectrons is found to fluctuate about nominal time. The
enhancement in line width is also found to be normally distributed.The simulation of
the efficiency of the surface showed that, it increased with the average intensity of
the incident light. This result is in accord with the fact that the number of
photoelectrons is proportional to the intensity of the incident light on the surface.

الملخص

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